DSF/FprEN 60749-28
Semiconductor devices - Mechanical and climatic test methods -- Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
pending
| Organization: | DS |
| Status: | pending |
| Page Count: | 24 |
| ICS Code (Electrical and electronic testing): | 19.080 |
Document History
July 3, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
IEC 60749-28:2017(E) establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure...
IEC 60749-28 ED1: Semiconductor devices – Mechanical and climatic test methods – Part 28: Electrostatic discharge (ESD) sensitivity testing – Charged device model (CDM) – device level
This part of IEC 60749 describes the direct contact charged device model (DC-CDM) for the electrostatic discharge test method which is used to evaluate the sensitivity of integrated circuits to...
DSF/FprEN 60749-28
Semiconductor devices - Mechanical and climatic test methods -- Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
A description is not available for this item.