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DSF/FPREN 60749-9

Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking

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Organization: DS
Status: active
Page Count: 11
ICS Code (Semiconductor devices in general): 31.080.01
scope:

The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and cleaning solutions commonly used during the removal of solder flux residue from the printed circuit board manufacturing process. This test is applicable for all package types. It is suitable for use in qualification and/or process monitor testing.. The test should be considered non-destructive. Electrical or mechanical rejects may be used for the purpose of this test. NOTE 1 - This procedure does not apply to laser branded packages. Many available solvents that could be used are either not sufficiently active, too stringent, or even dangerous to humans when in direct contact or when fumes are inhaled. NOTE 2 - The composition of solvents used in this standard, is considered typical and representative of the desired stringency as far as the usual coatings and markings are concerned.

Document History

June 20, 2017
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
IEC 60749-9:2017(E) is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of solvents and...
December 23, 2003
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
The purpose of this part of IEC 60749 is to test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during...
August 26, 2002
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
The purpose of this part of IEC 60749 is to test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaning solutions commonly used during...
DSF/FPREN 60749-9
Semiconductor devices – Mechanical and climatic test methods – Part 9: Permanence of marking
The purpose of this part of IEC 60749 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of...
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