Electrostatic Discharge Sensitivity Testing – Transmission Line Pulse (TLP) – Device Level
|Publication Date:||2 November 2016|
The scope and focus of this document pertains to TLP testing techniques of semiconductor components. The focus of the document is on quasi-static application of TLP testing techniques, however the techniques can also be applied to study transient behavior of semiconductor components.
The purpose of the document is to establish a methodology for both testing and reporting information associated with transmission line pulse (TLP) testing. This document covers TLP systems applying quasi-rectangular pulses with a wide range of pulse widths and rise times. All such systems are referred to as TLP systems.