ESD STM5.5.1
Electrostatic Discharge Sensitivity Testing – Transmission Line Pulse (TLP) – Device Level
Organization: | ESD |
Publication Date: | 2 November 2016 |
Status: | active |
Page Count: | 36 |
scope:
The scope and focus of this document pertains to TLP testing techniques of semiconductor components. The focus of the document is on quasi-static application of TLP testing techniques, however the techniques can also be applied to study transient behavior of semiconductor components.
Purpose
The purpose of the document is to establish a methodology for both testing and reporting information associated with transmission line pulse (TLP) testing. This document covers TLP systems applying quasi-rectangular pulses with a wide range of pulse widths and rise times. All such systems are referred to as TLP systems.
Document History



