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DLA - SMD-5962-96558 REV C

MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL- OUT SHIFT REGISTER, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 26 May 2004
Status: inactive
Page Count: 24

Document History

October 25, 2017
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL / PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes. Replaceability....
September 12, 2013
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL / PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q ) and space application (device class V). A choice of case outlines and lead finishes are...
August 1, 2012
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL / PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device class Q ) and space application (device class V). A choice of case outlines and lead finishes are...
March 9, 2011
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL / PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
October 5, 2009
MICROCIRCUIT, DIGITAL, ADVANCED CMOS, RADIATION HARDENED, 8-BIT SERIAL / PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...
SMD-5962-96558 REV C
May 26, 2004
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL- OUT SHIFT REGISTER, MONOLITHIC SILICON
A description is not available for this item.
November 1, 2001
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL- OUT SHIFT REGISTER, MONOLITHIC SILICON
A description is not available for this item.
November 18, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL- OUT SHIFT REGISTER, MONOLITHIC SILICON
A description is not available for this item.
July 16, 1996
MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL- OUT SHIFT REGISTER, MONOLITHIC SILICON
This drawing documents two product assurance class levels consisting of high reliability (device classes Q and M) and space application (device class V). A choice of case outlines and lead finishes...

References

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