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DOD - SMD 5962-95812

MICROCIRCUIT, LINEAR RADIATION HARDENED DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 6 March 2017
Status: active
Page Count: 23
scope:

This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer's Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

SMD 5962-95812
March 6, 2017
MICROCIRCUIT, LINEAR RADIATION HARDENED DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
August 3, 2016
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
November 18, 2014
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
May 1, 2013
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
August 15, 2006
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 3, 1998
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
December 21, 1997
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This appendix establishes minimum requirements for microcircuit die to be supplied under the Qualified Manufacturers List (QML) Program. QML microcircuit die meeting the requirements of MIL-PRF-38535...
November 14, 1995
MICROCIRCUIT, LINEAR RADIATION HARDENED CMOS, DUAL, DPST ANALOG SWITCHES, MONOLITHIC SILICON
This drawing forms a part of a one part - one part number documentation system (see 6.6 herein). Two product assurance classes consisting of military high reliability (device classes Q and M) and...

References

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