JEDEC JESD 659
Failure-Mechanism-Driven Reliability Monitoring
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| Organization: | JEDEC |
| Publication Date: | 1 January 2017 |
| Status: | active |
| Page Count: | 16 |
scope:
This standard describes essential requirements for a reliability monitor for components and subassemblies based on the measurement of failure mechanisms which limit reliability. It applies through the postqualification production period. Both intrinsic (wearout and systematic) and extrinsic (defect-based) sources of failure are addressed.
Document History
JEDEC JESD 659
January 1, 2017
Failure-Mechanism-Driven Reliability Monitoring
This standard describes essential requirements for a reliability monitor for components and subassemblies based on the measurement of failure mechanisms which limit reliability. It applies through...
February 1, 2007
Failure-Mechanism-Driven Reliability Monitoring
This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The...
September 1, 1999
Failure-Mechanism-Driven Reliability Monitoring
A description is not available for this item.
January 1, 1996
Failure-Mechanism-Driven Reliability Monitoring
A description is not available for this item.