JEDEC JESD 659
Failure-Mechanism-Driven Reliability Monitoring
inactive
Buy Now
| Organization: | JEDEC |
| Publication Date: | 1 February 2007 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The standard also describes the condition under with a monitor may be replaced or eliminated. Formerly known as EIA-659, that superseded JESD29-A (July 1996). Became JESD625-A after revision, September 1999.
Document History
January 1, 2017
Failure-Mechanism-Driven Reliability Monitoring
This standard describes essential requirements for a reliability monitor for components and subassemblies based on the measurement of failure mechanisms which limit reliability. It applies through...
JEDEC JESD 659
February 1, 2007
Failure-Mechanism-Driven Reliability Monitoring
This method establishes requirements for application of Statistical Reliability Monitoring 'SRM' technology to monitor and improve the reliability of electronic components and subassemblies. The...
September 1, 1999
Failure-Mechanism-Driven Reliability Monitoring
A description is not available for this item.
January 1, 1996
Failure-Mechanism-Driven Reliability Monitoring
A description is not available for this item.
Related Products
Searching for related products...