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BSI - BS EN 60679-1

Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification

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Organization: BSI
Publication Date: 31 July 2007
Status: inactive
Page Count: 88
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN 60679-1
December 31, 2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
July 31, 2007
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.

References

This document references:
BS EN 60679-5 - Quartz Crystal Controlled Oscillators of Assessed Quality - Part 5: Sectional Specification - Qualification Approval
Published by BSI on November 15, 1998
A description is not available for this item.
This document references:
IEC 60068-2-20 - Environmental testing – Part 2-20: Tests – Tests Ta and Tb: Test methods for solderability and resistance to soldering heat of devices with leads
Published by IEC on March 1, 2021
This part of IEC 60068 outlines Tests Ta and Tb, applicable to devices with leads and leads themselves. Soldering tests for surface mounting devices (SMD) are described in IEC 60068-2-58. This...
This document references:
IEC 60068-2-45 - Basic Environmental Testing Procedures Part 2: Tests Test XA and Guidance: Immersion in Cleaning Solvents
Published by IEC on January 1, 1980
A description is not available for this item.
This document references:
IEC 60068-2-64 - Environmental testing – Part 2-64: Tests – Test Fh: Vibration, broadband random and guidance
Published by IEC on October 1, 2019
This part of IEC 60068 demonstrates the adequacy of specimens to resist dynamic loads without unacceptable degradation of its functional and/or structural integrity when subjected to the specified...
This document references:
HD 323.2.20 S3 - Basic Environmental Testing Procedures Part 2: Tests Test T: Soldering
Published by CENELEC on January 1, 1992
A description is not available for this item.
This document references:
BS EN 60679-5 - Quartz Crystal Controlled Oscillators of Assessed Quality - Part 5: Sectional Specification - Qualification Approval
Published by BSI on November 15, 1998
A description is not available for this item.
This document is referenced by:
BS EN 60679-4-1 - Quartz Crystal Controlled Oscillators of Assessed Quality - Part 4-1: Blank Detail Specification - Capability Approval
Published by BSI on June 15, 1998
A description is not available for this item.
This document is referenced by:
BS EN 60679-6 - Quartz crystal controlled oscillators of assessed quality Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
Published by BSI on June 30, 2011
A description is not available for this item.
This document is referenced by:
BS EN IEC 61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections Part 2: Ceramic enclosures
Published by BSI on August 31, 2018
A description is not available for this item.
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