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BSI - BS EN 60679-1

Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification

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Organization: BSI
Publication Date: 15 May 1998
Status: inactive
Page Count: 74
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN 60679-1
December 31, 2017
Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
July 31, 2007
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.
BS EN 60679-1
May 15, 1998
Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification
A description is not available for this item.

References

This document references:
HD 323.2.10 S3 - Basic Environmental Testing Procedures Part 2: Tests Test J and Guidance : Mould Growth
Published by CENELEC on January 1, 1992
A description is not available for this item.
This document references:
IEC 60027-2 - Letter symbols to be used in electrical technology - Part 2: Telecommunications and electronics
Published by IEC on January 1, 2019
This part of IEC 60027 is applicable to telecommunications and electronics. It gives names and symbols for quantities and their units.
This document references:
IEC 60748-2 - Semiconductor Devices - Integrated Circuits - Part 2: Digital Integrated Circuits
Published by IEC on December 1, 1997
A description is not available for this item.
This document references:
IEC 60068-2-58 - Environmental testing – Part 2-58: Tests – Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
Published by IEC on July 1, 2017
This part of IEC 60068 outlines test Td, applicable to surface mounting devices (SMD) This document provides procedures for determining the solderability, resistance to dissolution of metallization...
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