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DIN EN 62276

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016

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Organization: DIN
Publication Date: 1 August 2017
Status: active
Page Count: 45
ICS Code (Piezoelectric devices): 31.140
scope:

Diese Dokument gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat(LN)-, Lithiumtantalat(LT)-, Lithiumtetraborat(LBO)-Kristallen und Lanthanum-Gallium-Silikat (LGS), die für die Verwendung als Substrate bei der Herstellung von Oberflächenwellen-(OFW-)Filtern und Resonatoren vorgesehen sind.

Document History

DIN EN 62276
August 1, 2017
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
Diese Dokument gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat(LN)-, Lithiumtantalat(LT)-, Lithiumtetraborat(LBO)-Kristallen und...
April 1, 2015
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1116/CD:2014)
A description is not available for this item.
August 1, 2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013
Diese Internationale Norm gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat-(LN-), Lithiumtantalat-(LT-), Lithiumtetraborat-(LBO-)Kristallen und...
April 1, 2006
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005
A description is not available for this item.

References

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