DIN EN 62276
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013
inactive
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| Organization: | DIN |
| Publication Date: | 1 August 2013 |
| Status: | inactive |
| Page Count: | 43 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
Diese Internationale Norm gilt für die Herstellung von
Einkristall-Wafern aus synthetischen Quarzkristallen,
Lithiumniobat-(LN-),
Document History
August 1, 2017
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016
Diese Dokument gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat(LN)-, Lithiumtantalat(LT)-, Lithiumtetraborat(LBO)-Kristallen und...
April 1, 2015
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1116/CD:2014)
A description is not available for this item.
DIN EN 62276
August 1, 2013
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012); German version EN 62276:2013
Diese Internationale Norm gilt für die Herstellung von Einkristall-Wafern aus synthetischen Quarzkristallen, Lithiumniobat-(LN-), Lithiumtantalat-(LT-), Lithiumtetraborat-(LBO-)Kristallen und...
April 1, 2006
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005
A description is not available for this item.