JEDEC JESD 22-A122
Power Cycling
inactive
Buy Now
| Organization: | JEDEC |
| Publication Date: | 1 August 2007 |
| Status: | inactive |
| Page Count: | 18 |
scope:
This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component, simulating the non-uniform temperature distribution resulting from a device powering on and off in the application.
Document History
November 1, 2023
Power Cycling
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...
June 1, 2016
Power Cycling
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...
JEDEC JESD 22-A122
August 1, 2007
Power Cycling
This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...