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JEDEC JESD 22-A122

Power Cycling

inactive
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Organization: JEDEC
Publication Date: 1 August 2007
Status: inactive
Page Count: 18
scope:

This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component, simulating the non-uniform temperature distribution resulting from a device powering on and off in the application.

Document History

November 1, 2023
Power Cycling
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...
June 1, 2016
Power Cycling
This Test Method establishes a uniform method for performing solid state device package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...
JEDEC JESD 22-A122
August 1, 2007
Power Cycling
This Test Method establishes a uniform method for performing component package power cycling stress test. This specification covers power induced temperature cycling of a packaged component,...

References

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