TSE - TS EN 60749-30
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
active
| Organization: | TSE |
| Publication Date: | 19 January 2010 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Bu standard, sizdirmaz olmayan yuzey montaj elemanlarina (SMD)on sartlandirma yapilmasiyla ilgili standard islemleri kapsar
Document History
June 14, 2012
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Bu standard, sizdirmaz olmayan yuzey montaj elemanlarina (SMD)on sartlandirma yapilmasiyla ilgili standard islemleri kapsar
January 31, 2012
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
TS EN 60749-30
January 19, 2010
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Bu standard, sizdirmaz olmayan yuzey montaj elemanlarina (SMD)on sartlandirma yapilmasiyla ilgili standard islemleri kapsar
January 17, 2006
IEC 60749-30, Ed. 1: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
This standard applies to ceramic tile grouts for internal and external tile installations on walls and floors.