TSE - TS EN 60749-30/A1
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
active
| Organization: | TSE |
| Publication Date: | 31 January 2012 |
| Status: | active |
| ICS Code (Noise emitted by machines and equipment): | 17.140.20 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
June 14, 2012
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Bu standard, sizdirmaz olmayan yuzey montaj elemanlarina (SMD)on sartlandirma yapilmasiyla ilgili standard islemleri kapsar
TS EN 60749-30/A1
January 31, 2012
Semiconductor devices - Mechanical and climatic test methods -- Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
A description is not available for this item.
January 19, 2010
Semiconductor devices - Mechanical and climatic test methods Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
Bu standard, sizdirmaz olmayan yuzey montaj elemanlarina (SMD)on sartlandirma yapilmasiyla ilgili standard islemleri kapsar
January 17, 2006
IEC 60749-30, Ed. 1: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
This standard applies to ceramic tile grouts for internal and external tile installations on walls and floors.