DS/EN 61189-5-503
Test methods for electrical materials, printed board and other interconnection structures and assemblies – Part 5-503: General test method for materials and assemblies – Conductive anodic filaments (CAF) testing of circuit boards
active, Most Current
| Organization: | DS |
| Publication Date: | 14 August 2017 |
| Status: | active |
| Page Count: | 29 |
| ICS Code (Printed circuits and boards): | 31.180 |
scope:
IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity
Document History
DS/EN 61189-5-503
August 14, 2017
Test methods for electrical materials, printed board and other interconnection structures and assemblies – Part 5-503: General test method for materials and assemblies – Conductive anodic filaments (CAF) testing of circuit boards
IEC 61189-5-503:2017(E) specifies the conductive anodic filament (hereafter referred to as CAF) and specifies not only the steady-state temperature and humidity test, but also a temperature-humidity...
Test methods for electrical materials, printed board and other interconnection structures and assemblies – Part 5-503: General test method for materials and assemblies – Conductive anodic filaments (CAF) testing of circuit boards
This international standard specifies the conductive anodic filament (hereafter called as CAF) and specifies not only steady state temperature and humidity test but temperature-humidity cyclic test,...