CEI EN 62435-2
Electronic components - Long-term storage of electronic semiconductor devices Part 2: Deterioration mechanisms
active, Most Current
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| Organization: | CEI |
| Publication Date: | 1 August 2017 |
| Status: | active |
| Page Count: | 28 |
| ICS Code (Electronic components in general): | 31.020 |
scope:
This part of IEC 62435 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic deterioration mechanisms. Typically, this part is used in conjunction with IEC 62435-1 for any device longterm storage whose duration may be more than 12 months for product scheduled for long duration storage. Mechanisms that apply to specific component types are detailed in IEC 62435-5 to IEC 62435-9 (proposed)1.
1 Under preparation.
Document History
CEI EN 62435-2
August 1, 2017
Electronic components - Long-term storage of electronic semiconductor devices Part 2: Deterioration mechanisms
This part of IEC 62435 is related to deterioration mechanisms and is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes...