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IEC 60747-9

Semiconductor devices – Discrete devices – Part 9: Insulated-gate bipolar transistors (IGBTs)

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Organization: IEC
Publication Date: 1 September 2007
Status: inactive
Page Count: 122
ICS Code (Transistors): 31.080.30
ICS Code (Semiconductor devices in general): 31.080.01
scope:

This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).

Document History

IEC 60747-9
November 1, 2019
Semiconductor devices – Part 9: Discrete devices – Insulated-gate bipolar transistors (IGBTs)
This part of IEC 60747 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for...
IEC 60747-9
September 1, 2007
Semiconductor devices – Discrete devices – Part 9: Insulated-gate bipolar transistors (IGBTs)
This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate...
IEC 60747-9
November 1, 2001
Semiconductor Devices - Discrete Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.
IEC 60747-9
August 1, 1998
Surface Mounting Technology - Discrete Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.
IEC 60747-9
August 1, 1998
Semiconductor Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.

References

This document references:
IEC 61340-4-6 - Electrostatics – Part 4-6: Standard test methods for specific applications – Wrist straps
Published by IEC on May 1, 2015
This part of IEC 61340 provides electrical and mechanical test methods and performance limits for evaluation, acceptance and periodic verification testing of wrist straps. NOTE All dimensions are...
This document references:
IEC 61340-4-9 - Electrostatics – Part 4-9: Standard test methods for specific applications – Garments
Published by IEC on April 1, 2016
This part of IEC 61340 provides test methods for measuring the electrical resistance of garments used for static control applications. These test methods can be used for evaluating outer garments...
This document references:
IEC 60050-521 - AMENDMENT 2 International Electrotechnical Vocabulary (IEV) – Part 521: Semiconductor devices and integrated circuits
Published by IEC on December 1, 2018
A description is not available for this item.
This document references:
IEC 60747-1 - Semiconductor devices – Part 1: General
Published by IEC on August 1, 2010
This part of IEC 60747 gives the general requirements applicable to the discrete semiconductor devices and integrated circuits covered by the other parts of IEC 60747 and IEC 60748 (see Annex A).
This document references:
IEC 61340-2-1 - Electrostatics – Part 2-1: Measurement methods – Ability of materials and products to dissipate static electric charge
Published by IEC on August 1, 2015
This part of IEC 61340 describes test methods for measuring the rate of dissipation of static charge of insulating and static dissipative materials and products. It includes a generic description of...
This document is referenced by:
BS EN 60749-23 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Published by BSI on June 24, 2004
A description is not available for this item.
This document is referenced by:
EN 60747-15 - Semiconductor devices - Discrete devices - Part 15: Isolated power semiconductor devices
Published by CENELEC on March 1, 2012
This part of IEC 60747 gives the requirements for isolated power semiconductor devices excluding devices with incorporated control circuits. These requirements are additional to those given in other...
This document is referenced by:
IEC 61360-1 - Standard data element types with associated classification scheme – Part 1: Definitions – Principles and methods
Published by IEC on July 1, 2017
This part of IEC 61360 specifies principles for the definition of the properties and associated attributes and explains the methods for representing verbally defined concepts with appropriate data...
This document is referenced by:
CEI EN 60749-34 - Semiconductor devices - Mechanical and climatic test methods Part 34: Power cycling
Published by CEI on February 1, 2012
Scope and object This part of IEC 60749 describes a test method used to determine the resistance of a semiconductor device to thermal and mechanical stresses due to cycling the power dissipation of...
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