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IEC 60747-9

Semiconductor devices – Discrete devices – Part 9: Insulated-gate bipolar transistors (IGBTs)

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Organization: IEC
Publication Date: 1 September 2007
Status: inactive
Page Count: 122
ICS Code (Transistors): 31.080.30
ICS Code (Semiconductor devices in general): 31.080.01
scope:

This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate bipolar transistors (IGBTs).

Document History

November 1, 2019
Semiconductor devices – Part 9: Discrete devices – Insulated-gate bipolar transistors (IGBTs)
This part of IEC 60747 specifies product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for...
IEC 60747-9
September 1, 2007
Semiconductor devices – Discrete devices – Part 9: Insulated-gate bipolar transistors (IGBTs)
This part of IEC 60747 gives product specific standards for terminology, letter symbols, essential ratings and characteristics, verification of ratings and methods of measurement for insulated-gate...
November 1, 2001
Semiconductor Devices - Discrete Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.
August 1, 1998
Surface Mounting Technology - Discrete Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.
August 1, 1998
Semiconductor Devices - Part 9: Insulated-Gate Bipolar Transistors (IGBTs)
A description is not available for this item.

References

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