NEN-EN-IEC 62132-1
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 March 2016 |
| Status: | active |
| Page Count: | 61 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
NEN-EN-IEC 62132-1 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).
Document History
NEN-EN-IEC 62132-1
March 1, 2016
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
NEN-EN-IEC 62132-1 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
December 1, 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
Annex ZA added
March 1, 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions
This part of IEC 62132 provides general information and definitions on measurement of conducted and radiated electromagnetic immunity of integrated circuits (ICs) to conducted and radiated...