NEN-EN-IEC 60444-6
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 6: Measurement of drive level dependence (DLD)
inactive
| Organization: | NEN |
| Publication Date: | 1 August 1997 |
| Status: | inactive |
| Page Count: | 46 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
Specifies a simple method of measurement and describes a suitable measuring network. Measuring method and network are suitable for use over the frequency range 1 MHz to 200 MHz. The measuring circuit consists basically of a pi-network connected with coaxial cables to the associated equipment.
Document History
October 1, 2013
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based...
NEN-EN-IEC 60444-6
August 1, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 6: Measurement of drive level dependence (DLD)
Specifies a simple method of measurement and describes a suitable measuring network. Measuring method and network are suitable for use over the frequency range 1 MHz to 200 MHz. The measuring circuit...