NEN-EN-IEC 60749-9
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
inactive
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| Page Count: | 26 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaningsolutions commonly used during the removal of solder flux residue from the printed circuit board assembly process.
Document History
July 1, 2017
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
The purpose of NEN-EN-IEC 60749-9 is to determine whether the marks on solid state semiconductor devices will remain legible when subjected to the application and removal of labels or the use of...
NEN-EN-IEC 60749-9
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 9: Permanence of marking
Test and verify that the markings on semiconductor devices will not become illegible when subject to solvents or cleaningsolutions commonly used during the removal of solder flux residue from the...