NEN-EN-IEC 60749-32/A1
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 September 2010 |
| Status: | active |
| Page Count: | 13 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NEN-EN-IEC 60749-32/A1
September 1, 2010
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
A description is not available for this item.
August 1, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Applicable to semiconductor devices (discrete devices and integrated circuits). The object of this test is to determine whether the device ignites due to external heating. The test used a needle...