NEN-ISO 16700
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
active, Most Current
| Organization: | NEN |
| Publication Date: | 1 August 2016 |
| Status: | active |
| Page Count: | 29 |
| ICS Code (Optical equipment): | 37.020 |
scope:
NEN-ISO 16700 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
Document History
NEN-ISO 16700
August 1, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
NEN-ISO 16700 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to...
March 1, 2004
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is...