NEN-ISO 16700
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
inactive
| Organization: | NEN |
| Publication Date: | 1 March 2004 |
| Status: | inactive |
| Page Count: | 26 |
| ICS Code (Optical equipment): | 37.020 |
scope:
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to magnifications determined by the available size range of structures in the calibrating reference material. This International Standard does not apply to the dedicated critical dimension measurement SEM.
Document History
August 1, 2016
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
NEN-ISO 16700 specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is limited to...
NEN-ISO 16700
March 1, 2004
Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
This International Standard specifies a method for calibrating the magnification of images generated by a scanning electron microscope (SEM) using an appropriate reference material. This method is...