NEN-EN-IEC 60749-29
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
inactive
| Organization: | NEN |
| Publication Date: | 1 February 2004 |
| Status: | inactive |
| Page Count: | 54 |
| ICS Code (Semiconductor devices): | 31.080 |
scope:
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to define latch-up failure criteria. Latch-up characteristics are used in determining product reliability and minimizing "No Trouble Found" and "Electrical Overstres" failures due to latch-up.
Document History
September 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
This part of IEC 60749 covers the I-test and the overvoltage latch-up testing of integrated circuits. This test is classified as destructive. The purpose of this test is to establish a method for...
NEN-EN-IEC 60749-29
February 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Covers the I-test and the overvoltage latch-up testing of integrated circuits. The purpose of this test is to establish a method for determining integrated circuit latch-up characteristics and to...