JEDEC JESD 89
Test Method for Alpha Source Accelerated Soft Error Rate
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| Organization: | JEDEC |
| Publication Date: | 1 October 2007 |
| Status: | active |
| Page Count: | 20 |
scope:
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flipflops) by measuring the error rate while the device is irradiated by a characterized, solid alpha source.
Document History
November 1, 2007
Test Method for Beam Accelerated Soft Error Rate
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error...
JEDEC JESD 89
October 1, 2007
Test Method for Alpha Source Accelerated Soft Error Rate
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g....
October 1, 2007
Test Method for Real-Time Soft Error Rate
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or...
October 1, 2006
Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and...
September 1, 2005
Test Method for Beam Accelerated Soft Error Rate
A description is not available for this item.
November 1, 2004
Test Method For Alpha Source Accelerated Soft Error Rate
A description is not available for this item.
June 1, 2004
System Soft Error Rate (SSER) Test Method
A description is not available for this item.
July 1, 2001
Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
A description is not available for this item.
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