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JEDEC JESD 89

Test Method for Beam Accelerated Soft Error Rate

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Organization: JEDEC
Publication Date: 1 November 2007
Status: active
Page Count: 28
scope:

This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error rate while the device is irradiated in a neutron or proton beam of known flux. The results of this accelerated test can be used to estimate the terrestrial cosmic ray induced SER for a given terrestrial cosmic ray radiation environment. This test cannot be used to project alpha-particleinduced SER.

Document History

JEDEC JESD 89
November 1, 2007
Test Method for Beam Accelerated Soft Error Rate
This test is used to determine the terrestrial cosmic ray Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) by measuring the error...
JEDEC JESD 89
October 1, 2007
Test Method for Alpha Source Accelerated Soft Error Rate
This test method is offered as standardized procedure to determine the alpha particle Soft Error Rate (SER) sensitivity of solid state volatile memory arrays and bistable logic elements (e.g....
JEDEC JESD 89
October 1, 2007
Test Method for Real-Time Soft Error Rate
This test is used to determine the Soft Error Rate (SER) of solid state volatile memory arrays and bistable logic elements (e.g. flip-flops) for errors which require no more than re-reading or...
JEDEC JESD 89
October 1, 2006
Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
This specification defines the standard requirements and procedures for terrestrial soft-error-rate (SER)testing of integrated circuits and reporting of results. Both real-time (unaccelerated) and...
JEDEC JESD 89
September 1, 2005
Test Method for Beam Accelerated Soft Error Rate
A description is not available for this item.
JEDEC JESD 89
November 1, 2004
Test Method For Alpha Source Accelerated Soft Error Rate
A description is not available for this item.
JEDEC JESD 89
June 1, 2004
System Soft Error Rate (SSER) Test Method
A description is not available for this item.
JEDEC JESD 89
July 1, 2001
Measurement and Reporting of Alpha Particles and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices
A description is not available for this item.
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References

This document is referenced by:
IEC TS 62686-1 - Process management for avionics – Electronic components for aerospace, defence and high performance (ADHP) applications – Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by IEC on April 1, 2020
This part of IEC 62686, which is a Technical Specification, defines the minimum requirements for general purpose "off the shelf" COTS (commercial off-the-shelf) integrated circuits and discrete...
This document is referenced by:
JEDEC JESD 88 - JEDEC Dictionary of Terms for Solid State Technology
Published by JEDEC on July 1, 2007
Each term and definition in this dictionary has been included strictly for application within the solid-state industry. Many of the terms and definitions in this dictionary may have applicability...
This document is referenced by:
BS PD IEC TS 62686-1 - Process management for avionics - Electronic components for aerospace, defence and high performance (ADHP) applications Part 1: General requirements for high reliability integrated circuits and discrete semiconductors
Published by BSI on April 30, 2020
A description is not available for this item.
This document is referenced by:
JEDEC JESD 234 - TEST STANDARD FOR THE MEASUREMENT OF PROTON RADIATION SINGLE EVENT EFFECTS IN ELECTRONIC DEVICES
Published by JEDEC on October 1, 2013
This test standard defines the requirements and procedures for 40 to 500 MeV proton irradiation of electronic devices for Single Event Effects (SEE), and reporting the results. Protons are capable of...
This document is referenced by:
JEDEC JEP 70 - Guide to Standards and Publications Relating to Quality and Reliability of Electronic Hardware
Published by JEDEC on October 1, 2013
This publication contains a listing and description of commonly used quality and reliability related publications applicable to the semiconductor industry. It is intended to be a reference aid in...
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