NEN 10749
Semiconductor devices - Mechanical and climatic test methods
inactive
| Organization: | NEN |
| Publication Date: | 1 October 1985 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices.
Document History
April 1, 1997
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity...
NEN 10749
October 1, 1985
Semiconductor devices - Mechanical and climatic test methods
This standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required...