NEN 10749
Semiconductor devices - Mechanical and climatic test methods
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 April 1997 |
| Status: | inactive |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity devices. This standard has taken account, wherever possible, IEC 68. The object of this standard is to establish uniform preferred test methods with preferred values for stress levels for judging the environmental properties of semiconductor devices. In case of contradiction between this standard and a relevant specification, the latter shall govern.
Document History
NEN 10749
April 1, 1997
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required for non-cavity...
October 1, 1985
Semiconductor devices - Mechanical and climatic test methods
This standard lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. However, additional test methods may be required...