NEN-IEC 61649
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
inactive, Most Current
| Organization: | NEN |
| Publication Date: | 1 July 1997 |
| Status: | inactive |
| Page Count: | 44 |
| ICS Code (Application of statistical methods): | 03.120.30 |
| ICS Code (Quality in general): | 03.120.01 |
scope:
Provides numerical methods to complement graphical techniques in performing a goddness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. In addition, it provides a recommended procedure to obtain lower confidence limits for the 10% fractiles of the ligetime and for the reliability function. This standard is applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.
Document History
NEN-IEC 61649
July 1, 1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Provides numerical methods to complement graphical techniques in performing a goddness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence...