NEN-EN-IEC 60749-7
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
inactive
| Organization: | NEN |
| Publication Date: | 1 September 2002 |
| Status: | inactive |
| Page Count: | 30 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
Test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed service. It is applicable to semiconductor devices sealed in such a manner but generally only used for high realiability applications such as military or aerospace.
Document History
September 1, 2011
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a...
NEN-EN-IEC 60749-7
September 1, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
Test and measure the water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed service. It is applicable to semiconductor devices sealed in such a manner but...