NEN-EN 583-4
Non-destructive testing - Ultrasonic examination - Part 4: Examination for discontinuities perpendicular to the surface (includes A1:2003)
inactive
| Organization: | NEN |
| Publication Date: | 1 October 2002 |
| Status: | inactive |
| Page Count: | 21 |
| ICS Code (Non-destructive testing): | 19.100 |
scope:
Defines the principles for tandem- and LLT-examination for the detection of discontinuities perpendicular to the surface. The tandem- and LLT-examination should be used for the detection of planar discontinuities with distance to the surface greater than 15 mm. This standard has been prepared for the examination of metallic materials with a thickness between 40 mm and 500 mm and parallel or concentric surfaces. It can, however, be used for other materials and smaller thickness provided special measures are taken.
Document History
December 1, 2003
Non-destructive testing - Ultrasonic examination - Part 4: Examination for discontinuities perpendicular to the surface
modifications to: contents, foreword. delete annex ZA
NEN-EN 583-4
October 1, 2002
Non-destructive testing - Ultrasonic examination - Part 4: Examination for discontinuities perpendicular to the surface (includes A1:2003)
Defines the principles for tandem- and LLT-examination for the detection of discontinuities perpendicular to the surface. The tandem- and LLT-examination should be used for the detection of planar...
October 1, 2002
Non-destructive testing - Ultrasonic examination - Part 4: Examination for discontinuities perpendicular to the surface
Defines the principles for tandem- and LLT-examination for the detection of discontinuities perpendicular to the surface. The tandem- and LLT-examination should be used for the detection of planar...
November 1, 1999
Non-destructive testing - Ultrasonic examination - Part 4: Examination for discontinuities perpendicular to the surface
Defines the principles for tandem- and LLT-examination for the detection of discontinuities perpendicular to the surface. The tandem- and LLT-examination should be used for the detection of planar...