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NEN-EN-IEC 61010-031

Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test

inactive
Organization: NEN
Publication Date: 1 August 2015
Status: inactive
Page Count: 189
ICS Code (Electrical and electronic testing): 19.080
scope:

NEN-EN-IEC 61010-031 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for direct electrical connection between a part and electrical test and measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment. a) Type A: low-voltage and high-voltage, non-attenuating probe assemblies. Non-attenuating probe assemblies that are RATED for direct connection to voltages exceeding 30 V r.m.s., 42,4 V peak, or 60 V d.c., but not exceeding 63 kV. They do not incorporate components which are intended to provide a voltage divider function or a signal conditioning function, but they may contain non-attenuating components such as fuses (see Figure 1.) b) Type B: high-voltage attenuating or divider probe assemblies. Attenuating or divider probe assemblies that are RATED for direct connection to secondary voltages exceeding 1 kV r.m.s. or 1,5 kV d.c. but not exceeding 63 kV r.m.s. or d.c. The divider function may be carried out wholly within the probe assembly, or partly within the test or measurement equipment to be used with the probe assembly (see Figure 2). c) Type C: low-voltage attenuating or divider probe assemblies. Attenuating or divider probe assemblies for direct connection to voltages not exceeding 1 kV r.m.s. or 1,5 kV d.c. The signal conditioning function may be carried out wholly within the probe assembly, or partly within the test or measurement equipment intended to be used with the probe assembly (see Figure 3). d) Type D: low-voltage attenuating, non-attenuating or other signal conditioning probe assemblies, that are RATED for direct connection only to voltages not exceeding 30 V r.m.s., or 42,4 V peak, or 60 V d.c., and are suitable for currents exceeding 8 A

Document History

June 1, 2023
Safety requirements for electrical equipment for measurement, control, and laboratory use - Part 031: Safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement
This part of IEC 61010 specifies safety requirements for hand-held and hand-manipulated probe assemblies for electrical test and measurement, and their related accessories. These probe assemblies are...
November 1, 2021
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and handmanipulated probe assemblies for electrical test and measurement
A description is not available for this item.
November 1, 2021
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held and handmanipulated probe assemblies for electrical test and measurement
A description is not available for this item.
NEN-EN-IEC 61010-031
August 1, 2015
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
NEN-EN-IEC 61010-031 specifies safety requirements for hand-held and hand-manipulated probe assemblies of the types described below, and their related accessories. These probe assemblies are for...
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
A description is not available for this item.
March 1, 2002
Safety requirements for electrical equipment for measurement, control and laboratory use - Part 031: Safety requirements for hand-held probe assemblies for electrical measurement and test
Applies to hand-held and hand-manipulated probe assemblies of the types described below, and related accessories which are intended for professional, industrial process, and educational use. These...

References

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