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DLA - DSCC-DWG-V62/17618 REV A

MICROCIRCUIT, LINEAR, LEVEL 4 DO-160G EMC PROTECTED RS-485 TRANSCEIVER WITH FULL ±42 V FAULT PROTECTION, MONOLITHIC SILICON

inactive
Organization: DLA
Publication Date: 2 May 2018
Status: inactive
Page Count: 18
scope:

This drawing documents the general requirements of a high performance Level 4 DO-160G electromagnetic capability (EMC) protected RS-485 transceiver with full ±42 V fault protection microcircuit, with an operating temperature range of -55°C to +125°C.

Document History

DSCC-DWG-V62/17618 REV B
August 17, 2023
MICROCIRCUIT, LINEAR, LEVEL 4 DO-160G EMC PROTECTED RS-485 TRANSCEIVER WITH FULL ±42 V FAULT PROTECTION, MONOLITHIC SILICON
Scope. This drawing documents the general requirements of a high performance Level 4 DO-160G electromagnetic capability (EMC) protected RS-485 transceiver with full ±42 V fault protection...
DSCC-DWG-V62/17618 REV A
May 2, 2018
MICROCIRCUIT, LINEAR, LEVEL 4 DO-160G EMC PROTECTED RS-485 TRANSCEIVER WITH FULL ±42 V FAULT PROTECTION, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Level 4 DO-160G electromagnetic capability (EMC) protected RS-485 transceiver with full ±42 V fault protection microcircuit, with...
DSCC-DWG-V62/17618
December 7, 2017
MICROCIRCUIT, LINEAR, LEVEL 4 DO-160G EMC PROTECTED RS-485 TRANSCEIVER WITH FULL ±42 V FAULT PROTECTION, MONOLITHIC SILICON
This drawing documents the general requirements of a high performance Level 4 DO-160G electromagnetic capability (EMC) protected RS-485 transceiver with full ±42 V fault protection microcircuit, with...

References

This document references:
IEC 61000-4-2 - Electromagnetic compatibility (EMC) – Part 4-2: Testing and measurement techniques – Electrostatic discharge immunity test
Published by IEC on December 1, 2008
This International Standard relates to the immunity requirements and test methods for electrical and electronic equipment subjected to static electricity discharges, from operators directly, and to...
This document references:
IEC 61000-4-4 - Electromagnetic compatibility (EMC) – Part 4-4: Testing and measurement techniques – Electrical fast transient/burst immunity test
Published by IEC on April 1, 2012
This part of IEC 61000 relates to the immunity of electrical and electronic equipment to repetitive electrical fast transients. It gives immunity requirements and test procedures related to...
This document references:
IEC 61000-4-5 - Electromagnetic compatibility (EMC) – Part 4-5: Testing and measurement techniques – Surge immunity test
Published by IEC on August 1, 2017
Scope and object This part of IEC 61000 relates to the immunity requirements, test methods, and range of recommended test levels for equipment with regard to unidirectional surges caused by...
This document references:
JEP95 BOOK 1 - Book One Registered and Standard Outlines for Solid State and Related Products
Published by JEDEC on March 1, 1997
PREFACE This Publication contains those solid state product outlines and other associated drawings that have been registered and assigned a JEDEC designation and are printed on white paper. Product...
This document references:
JEDEC JESD 51 - Methodology for the Thermal Measurement of Component Packages (Single Semiconductor Device)
Published by JEDEC on December 1, 1995
This standard and its subsequent addendum's, provides a standard for thermal measurement that, if followed fully, will provide correct and meaningful data that will allow for determination of...
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