CENELEC - EN 60068-2-58
Environmental testing - Part 2-58: Tests - Test Td: Test methods for solderability, resistance to dissolution of metallization and to soldering heat of surface mounting devices (SMD)
|Publication Date:||1 May 2015|
|ICS Code (Electronic component assemblies):||31.190|
|ICS Code (Environmental testing):||19.040|
This part of IEC 60068 outlines test Td, applicable to surface mounting devices (SMD).
This document provides procedures for determining the solderability, resistance to dissolution of metallization and resistance to soldering heat of devices in applications using solder alloys, which are eutectic or near eutectic tin lead (Pb), or lead-free alloys.
The procedures use either a solder bath or reflow method and are applicable only to specimens or products designed to withstand short term immersion in molten solder or limited exposure to reflow systems.
The solder bath method is applicable to SMDs designed for flow soldering and SMDs designed for reflow soldering when the solder bath (dipping) method is appropriate.
The reflow method is applicable to the SMD designed for reflow soldering, to determine the suitability of SMDs for reflow soldering and when the solder bath (dipping) method is not appropriate.
The objective of this standard is to ensure solderability of component lead or termination. In addition, test methods are provided to ensure that the component body can resist against the heat load to which it is exposed during soldering.
This standard covers tests Td1, Td2 and Td3
NOTE 1 For specific components other test methods may exist.
NOTE 2 Test Td does not apply to printed wiring board (PWB), see IEC 61189-3.
NOTE 3 Specific through-hole devices (where the device supplier has specifically documented support for reflow soldering) are also included in this standard.