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BSI - BS EN IEC 62228-1

Integrated circuits - EMC evaluation of transceivers Part 1: General conditions and definitions

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Organization: BSI
Publication Date: 30 June 2018
Status: active
Page Count: 14
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

BS EN IEC 62228-1
June 30, 2018
Integrated circuits - EMC evaluation of transceivers Part 1: General conditions and definitions
A description is not available for this item.

References

This document references:
IEC 62215-3 - Integrated circuits – Measurement of impulse immunity – Part 3: Non-synchronous transient injection method
Published by IEC on July 1, 2013
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily...
This document references:
IEC 62132-4 - Integrated circuits – Measurement of electromagnetic immunity 150 kHz to 1 GHz – Part 4: Direct RF power injection method
Published by IEC on February 1, 2006
This part of IEC 62132 describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method...
This document references:
EN 62132-4 - Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Published by CENELEC on May 1, 2006
A description is not available for this item.
This document references:
EN 62132-1 - Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
Published by CENELEC on February 1, 2016
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
This document references:
EN 62132-4 - Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz Part 4: Direct RF power injection method
Published by CENELEC on May 1, 2006
A description is not available for this item.
This document references:
IEC 62132-4 - Integrated circuits – Measurement of electromagnetic immunity 150 kHz to 1 GHz – Part 4: Direct RF power injection method
Published by IEC on February 1, 2006
This part of IEC 62132 describes a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances. This method...
This document references:
IEC 62215-3 - Integrated circuits – Measurement of impulse immunity – Part 3: Non-synchronous transient injection method
Published by IEC on July 1, 2013
This part of IEC 62215 specifies a method for measuring the immunity of an integrated circuit (IC) to standardized conducted electrical transient disturbances. The disturbances, not necessarily...
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