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CENELEC - EN 62132-1

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

active, Most Current
Organization: CENELEC
Publication Date: 1 February 2016
Status: active
Page Count: 30
ICS Code (Integrated circuits. Microelectronics): 31.200
scope:

This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines general test conditions, test equipment and setup, as well as the test procedures and content of the test reports for all parts of the IEC 62132 series. Test method comparison tables are included in Annex A to assist in selecting the appropriate measurement method(s).

Document History

EN 62132-1
February 1, 2016
Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
This part of IEC 62132 provides general information and definitions about measurement of electromagnetic immunity of integrated circuits (ICs) to conducted and radiated disturbances. It also defines...
February 1, 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1: General conditions and definitions
A description is not available for this item.
February 1, 2006
Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz Part 1: General conditions and definitions
A description is not available for this item.

References

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