CEI EN IEC 60749-12
Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency
active, Most Current
Buy Now
| Organization: | CEI |
| Publication Date: | 1 June 2018 |
| Status: | active |
| Page Count: | 14 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages.
NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
Document History
CEI EN IEC 60749-12
June 1, 2018
Semiconductor devices - Mechanical and climatic test methods Part 12: Vibration, variable frequency
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It...
March 1, 2004
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency
La presente Norma internazionale fa parte della serie IEC 60749.
Essa descrive un metodo di prova per determinare gli effetti sugli elementi strutturali interni di dispositivi a semiconduttore, di...