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TIA-455-130

Elevated Temperature Life Test for Laser Diodes

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Organization: TIA
Publication Date: 1 March 2001
Status: inactive
Page Count: 18
scope:

Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or current density is beyond the scope of this FOTP. This test is directed toward semiconductor laser diodes used in telecommunication applications for transmission or pumping purposes. Unless otherwise noted, this procedure applies to all semiconductor laser diodes that can be operated in a CW mode of operation; this includes pump lasers, direct and externally modulated lasers for both digital and analog applications. Also, this test is intended for sub-mounted (unpackaged) devices.

Document History

March 1, 2001
FOTP-130 Elevated Temperature Life Test for Laser Diodes
A description is not available for this item.
March 1, 2001
Elevated Temperature Life Test for Laser Diodes
Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or...
TIA-455-130
March 1, 2001
Elevated Temperature Life Test for Laser Diodes
Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or...
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