TIA/EIA-455-130
FOTP-130 Elevated Temperature Life Test for Laser Diodes
inactive
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| Organization: | TIA |
| Publication Date: | 1 March 2001 |
| Status: | inactive |
| Page Count: | 16 |
Document History
TIA/EIA-455-130
March 1, 2001
FOTP-130 Elevated Temperature Life Test for Laser Diodes
A description is not available for this item.
March 1, 2001
Elevated Temperature Life Test for Laser Diodes
Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or...
March 1, 2001
Elevated Temperature Life Test for Laser Diodes
Although the test is intended as a means to obtain a set of parameters that describe the reliability of the device population, the determination of an activation energy due to either temperature or...