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DS/ISO 3274

Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments

inactive, Most Current
Organization: DS
Publication Date: 12 March 1997
Status: inactive
Page Count: 31
ICS Code (Measuring instruments): 17.040.30
scope:

This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be applied to practical profile evaluation. It specifies the properties of the instrument which influence profile evaluation and it provides the basics of the specification of contact (stylus) instruments (profile meter and profile recorder).

Document History

DS/ISO 3274
March 12, 1997
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be...
January 1, 1981
Instruments for the measurement of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M
The standard defines the basic terms relating to system M profile meters, gives the basic parameters of these instruments and their numerical values and specifies their metrological characteristics.

References

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