DS/ISO 3274
Instruments for the measurement of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M
inactive
| Organization: | DS |
| Publication Date: | 1 January 1981 |
| Status: | inactive |
| ICS Code (Properties of surfaces): | 17.040.20 |
scope:
The standard defines the basic terms relating to system M profile meters, gives the basic parameters of these instruments and their numerical values and specifies their metrological characteristics.
Document History
March 12, 1997
Geometrical Product Specifications (GPS) - Surface texture: Profile method - Nominal characteristics of contact (stylus) instruments
This International Standard defines profiles and the general structure of contact (stylus) instruments for measuring surface roughness and waviness, enabling existing International Standards to be...
DS/ISO 3274
January 1, 1981
Instruments for the measurement of surface roughness by the profile method - Contact (stylus) instruments of consecutive profile transformation - Contact profile meters, system M
The standard defines the basic terms relating to system M profile meters, gives the basic parameters of these instruments and their numerical values and specifies their metrological characteristics.
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