DOD - SMD 5962-98513
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
inactive
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| Organization: | DOD |
| Publication Date: | 10 April 2008 |
| Status: | inactive |
| Page Count: | 39 |
scope:
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment (device class N). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels are reflected in the PIN. For device class N, the user is cautioned to assure that the device is appropriate for the application environment
intended Use:
Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.
Document History
June 24, 2016
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device class Q), and nontraditional performance environment (device...
SMD 5962-98513
April 10, 2008
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...
December 16, 1998
MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 13000 GATE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of space application (device class V), high reliability (device classes M and Q), and nontraditional performance environment...