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DOD - SMD 5962-99558

MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATION, MONOLITHIC SILICON

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Organization: DOD
Publication Date: 9 December 2008
Status: inactive
Page Count: 21
scope:

This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar applications (device class T). A choice of case outlines and lead finishes are available and are reflected in the Part or Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN. For device class T, the user is encouraged to review the manufacturer's Quality Management (QM) plan as part of their evaluation of these parts and their acceptability in the intended application.

intended Use:

Microcircuits conforming to this drawing are intended for use for Government microcircuit applications (original equipment), design applications, and logistics purposes.

Document History

July 8, 2016
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
October 15, 2012
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device class Q), space application (device class V) and for appropriate satellite and similar applications...
SMD 5962-99558
December 9, 2008
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATION, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
April 7, 2006
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATOR, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
October 10, 2002
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATOR, MONOLITHIC SILICON
A description is not available for this item.
April 25, 2001
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATOR, MONOLITHIC SILICON
A description is not available for this item.
February 15, 2000
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATOR, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...
January 24, 2000
MICROCIRCUIT, LINEAR, RADIATION HARDENED, HIGH SPEED, DUAL OUTPUT PULSE WIDTH MODULATOR, MONOLITHIC SILICON
This drawing documents three product assurance class levels consisting of high reliability (device classes Q and M), space application (device class V) and for appropriate satellite and similar...

References

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