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IEEE 1671.5

Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information

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Organization: IEEE
Publication Date: 26 September 2008
Status: inactive
Page Count: 29

Document History

March 26, 2015
Automatic Test Markup Language (ATML) Test Adapter Description
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description...
IEEE 1671.5
September 26, 2008
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information
A description is not available for this item.

References

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