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IEEE 1671.5

Automatic Test Markup Language (ATML) Test Adapter Description

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Organization: IEEE
Publication Date: 26 March 2015
Status: active
Page Count: 32
scope:

This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description of test adapter instance information.

Document History

IEEE 1671.5
March 26, 2015
Automatic Test Markup Language (ATML) Test Adapter Description
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by defining the interface between the UUT and the test station, and the specific description...
September 26, 2008
Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Adapter Information
A description is not available for this item.

References

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