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BSI - BS EN 60689

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

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Organization: BSI
Publication Date: 30 April 2009
Status: active
Page Count: 24
ICS Code (Piezoelectric devices): 31.140

Document History

BS EN 60689
April 30, 2009
Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
A description is not available for this item.

References

This document references:
IEC 60122-3 - Quartz crystal units of assessed quality – Part 3: Standard outlines and lead connections
Published by IEC on October 1, 2010
This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.
This document references:
IEC 60068-2-31 - Environmental testing – Part 2-31: Tests – Test Ec: Rough handling shocks, primarily for equipment-type specimens
Published by IEC on May 1, 2008
This part of IEC 60068 deals with a test procedure for simulating the effects of rough handling shocks, primarily in equipment-type specimens, the effects of knocks, jolts and falls which may be...
This document references:
IEC 61178-2 - Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional Specification - Capability Approval
Published by IEC on March 1, 1993
A description is not available for this item.
This document references:
IEC 60068-2-20 - Environmental testing – Part 2-20: Tests – Tests Ta and Tb: Test methods for solderability and resistance to soldering heat of devices with leads
Published by IEC on March 1, 2021
This part of IEC 60068 outlines Tests Ta and Tb, applicable to devices with leads and leads themselves. Soldering tests for surface mounting devices (SMD) are described in IEC 60068-2-58. This...
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