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IEC 60122-3

Quartz crystal units of assessed quality – Part 3: Standard outlines and lead connections

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Organization: IEC
Publication Date: 1 October 2010
Status: active
Page Count: 52
ICS Code (Piezoelectric devices): 31.140
scope:

This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.

Document History

IEC 60122-3
October 1, 2010
Quartz crystal units of assessed quality – Part 3: Standard outlines and lead connections
This part of IEC 60122 specifies the outline drawing for quartz crystal units with lead enclosures.
IEC 60122-3
July 1, 2001
Quartz Crystal Units of Assessed Quality - Part 3: Standard Outlines and Lead Connections
A description is not available for this item.
IEC 60122-3
January 1, 1977
Quartz Crystal Units for Frequency Control and Selection Part 3: Standard Outlines and Lead Connections
A description is not available for this item.

References

This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document references:
IEC 61178-3 - Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 3: Sectional Specification - Qualification Approval
Published by IEC on March 1, 1993
A description is not available for this item.
This document references:
IEC 61178-2-1 - Quartz Crystal Units - a Specification in the IEC Quality Assessment System for Electronic Components (IECQ) Part 2: Sectional Specification - Capability Approval - Section 1: Blank Detail Specification
Published by IEC on March 1, 1993
A description is not available for this item.
This document references:
ISO 1101 - Geometrical product specifications (GPS) - Geometrical tolerancing - Tolerances of form, orientation, location and run-out
Published by ISO on February 1, 2017
This document defines the symbol language for geometrical specification of workpieces and the rules for its interpretation. It provides the foundation for geometrical specification. The illustrations...
This document references:
IEC 60122-2 - Quartz Crystal Units for Frequency Control and Selection Part 2: Guide to the Use of Quartz Crystal Units for Frequency Control and Selection
Published by IEC on January 1, 1983
A description is not available for this item.
This document references:
IEC 60122-1 - Quartz crystal units of assessed quality – Part 1: Generic specification
Published by IEC on December 1, 2017
This part of IEC 60122 specifies the methods of test and general requirements for quartz crystal units of assessed quality using either capability approval or qualification approval procedures.
This document is referenced by:
CEI EN IEC 61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections Part 2: Ceramic enclosures
Published by CEI on January 1, 2019
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
This document is referenced by:
BS EN 61837-1 - Surface Mounted Piezoelectric Devices for Frequency Control and Selection - Standard Outlines and Terminal Lead Connections - Part 1: Plastic Moulded Enclosure Outlines
Published by BSI on September 30, 2012
A description is not available for this item.
This document is referenced by:
BS EN 61837-3 - Surface Mounted Piezoelectric Devices for Frequency Control and Selection - Standard Outlines and Terminal Lead Connections - Part 3: Metal Enclosures
Published by BSI on December 31, 2015
A description is not available for this item.
This document is referenced by:
EN IEC 61837-2 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
Published by CENELEC on July 1, 2018
This part of IEC 61837 deals with standard outlines and terminal lead connections as they apply to surface-mounted devices (SMD) for frequency control and selection in ceramic enclosures, and is...
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