NASA-LLIS-0297
Lessons Learned – Integrated Circuit Damage due to Capacitor Residual Charge
active, Most Current
| Organization: | NASA |
| Publication Date: | 4 August 1993 |
| Status: | active |
| Page Count: | 3 |
scope:
Abstract:
When a discrete capacitor was installed in an electronic assembly, a residual charge on the capacitor discharged through an integrated circuit itself and damaged the input circuit of the IC. Run tests to verify that procedures for the handling and storage of capacitors eliminate residual charges, and short capacitor leads just prior to installation.
Document History
NASA-LLIS-0297
August 4, 1993
Lessons Learned – Integrated Circuit Damage due to Capacitor Residual Charge
Abstract:
When a discrete capacitor was installed in an electronic assembly, a residual charge on the capacitor discharged through an integrated circuit itself and damaged the input circuit of the...
References
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