NASA-LLIS-1315
Lessons Learned – Increasing ESD Susceptibility of Integrated Circuits (2002)
active, Most Current
| Organization: | NASA |
| Publication Date: | 1 November 2002 |
| Status: | active |
| Page Count: | 3 |
scope:
Abstract:
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than human sensory perception thresholds.
Characterize the expected ESD levels and the susceptibility of ICs in the specific circuit prior to use (e.g., Human Body Model, Machine Model, and/or Charged Device Model). Base facility ESD control measures on the most ESD sensitive device to be protected.
Document History
NASA-LLIS-1315
November 1, 2002
Lessons Learned – Increasing ESD Susceptibility of Integrated Circuits (2002)
Abstract:
ESD susceptibility remains a pressing reliability issue in IC design due to the continually decreasing feature size and the increasing vulnerability to voltages that are much lower than...
References
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