ITU-T O.174
Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology
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| Organization: | ITU-T |
| Publication Date: | 1 November 2009 |
| Status: | active |
| Page Count: | 20 |
scope:
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical layer of synchronous Ethernet systems. A bit error rate test set may be part of the same equipment or may be physically separate.
[ITU-T O.172] specifies the test equipment for generation and measurement of jitter and wander in digital systems based on the synchronous digital hierarchy (SDH).
[ITU-T G.8261], [ITU-T G.8262] and [ITU-T G.8264] should be read in conjunction with this Recommendation.
Document History
February 1, 2012
(Pre-Published) Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology: Corrigendum 2
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
April 1, 2011
(Pre-Published) Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology Amendment 1
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
July 1, 2010
Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology Corrigendum 1
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...
ITU-T O.174
November 1, 2009
Jitter and wander measuring equipment for digital systems which are based on synchronous Ethernet technology
The test equipment specified in this Recommendation consists principally of a jitter/wander measurement function and a jitter/wander generation function. Measurements can be performed at the physical...